Capa

SCANNING ELECTRON MICROSCOPY IBD

SPRINGER
03 / 2014
9783662141724
Inglês

Sinopse

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.